发明名称 Process for producing doped semiconductor wafers from silicon, and the wafers produced thereby
摘要 A process for producing doped semiconductor wafers from silicon, which contain an electrically active dopant, such as boron, phosphorus, arsenic or antimony, optionally are additionally doped with germanium and have a defined thermal conductivity, involves producing a single crystal from silicon and processing further to form semiconductor wafers, the thermal conductivity being established by selecting a concentration of the electrically active dopant and optionally a concentration of germanium. Semiconductor wafers produced from silicon by the process have specific properties with regard to thermal conductivity and resistivity.
申请公布号 US2006035448(A1) 申请公布日期 2006.02.16
申请号 US20050199603 申请日期 2005.08.09
申请人 SILTRONIC AG 发明人 KRAUTBAUER RUPERT;FREY CHRISTOPH;ZITZELSBERGER SIMON;LEHMANN LOTHAR
分类号 H01L21/74;H01L21/425 主分类号 H01L21/74
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