发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having a trench type element isolating region easy in manufacturing process where the capacitance between adjacent elements is reduced and the stress is relaxed. SOLUTION: A buried insulation layer 2 and a semiconductor layer 3 are formed on a semiconductor substrate 1, and a field insulation film 6 having openings is formed on the semiconductor layer 3. Isolating trenches 4 pierce the semiconductor layer 3 located inside the opening of the field insulation film 6 and reach the buried insulation layer 2. An insulation film 7 is formed so as to cover the field insulation film 6 and above the isolating trenches 4 from their peripheries inwards like eaves. A side wall insulation film 5 is formed so as to close the openings of the insulation film 7 and involve voids 8 in the isolating trenches 4. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006049828(A) 申请公布日期 2006.02.16
申请号 JP20050148846 申请日期 2005.05.23
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MATSUI YASUSHI
分类号 H01L21/764;H01L21/76;H01L21/762 主分类号 H01L21/764
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