发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device having a trench type element isolating region easy in manufacturing process where the capacitance between adjacent elements is reduced and the stress is relaxed. SOLUTION: A buried insulation layer 2 and a semiconductor layer 3 are formed on a semiconductor substrate 1, and a field insulation film 6 having openings is formed on the semiconductor layer 3. Isolating trenches 4 pierce the semiconductor layer 3 located inside the opening of the field insulation film 6 and reach the buried insulation layer 2. An insulation film 7 is formed so as to cover the field insulation film 6 and above the isolating trenches 4 from their peripheries inwards like eaves. A side wall insulation film 5 is formed so as to close the openings of the insulation film 7 and involve voids 8 in the isolating trenches 4. COPYRIGHT: (C)2006,JPO&NCIPI
|
申请公布号 |
JP2006049828(A) |
申请公布日期 |
2006.02.16 |
申请号 |
JP20050148846 |
申请日期 |
2005.05.23 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
MATSUI YASUSHI |
分类号 |
H01L21/764;H01L21/76;H01L21/762 |
主分类号 |
H01L21/764 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|