发明名称 METHOD, PROGRAM, AND APPARATUS FOR APPEARANCE INSPECTION OF PRINTED CIRCUIT BOARD
摘要 <P>PROBLEM TO BE SOLVED: To provide a structure which can remove adverse effect by the silk-screen printing portion in the appearance inspection of an electronic component mounted on a printed circuit board. <P>SOLUTION: A silk inspection window is set to the circumference of the relevant electronic component 100. Next, the image data in the silk inspection window are converted into the binary code on the basis of the data of color/luminance of the previously registered silk screen printing portion. The silk screen printing portion 210 in the circumference of the component 100 on the printed circuit board is detected to define the predetermined inspection region W1, so as not to avoid overlapping with the detected silk screen printing portion 210. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006049348(A) 申请公布日期 2006.02.16
申请号 JP20040223927 申请日期 2004.07.30
申请人 FUJITSU LTD 发明人 WAKABAYASHI AKIHIRO
分类号 H05K13/08;G01N21/956;G06T1/00;H05K3/34 主分类号 H05K13/08
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