| 摘要 |
An additional element (2) can move in relation to a base element (1). A sensor device (4), which is connected to the base element (1), scans a material measure (5) which cooperates with the additional element (2) and which can move in relation to the sensor element (4). The sensor element (4) comprises at least two signal sensing elements (6), each of which delivers a binarizable measuring signal (x,y). A new area, wherein the material measure (5) is arranged relative to the sensor device (4), can be determined with the aid of simultaneously detected binarized measuring signals (x,y) per se or with the aid of a modification of at least one of the binarized measuring signals (x,y) in conjunction with an already known area. An evaluation device (9) determines, with the aid of the measuring signals (x,y), a position of the material measure (5) in relation to the sensor device (4) and determines therefrom an apparent absolute position (p',p") of the additional element (2) in relation to the base element (1). At least one correction factor (k), determined by the apparent absolute position (p',p") is read from a correction factor table (12) containing at least one correction factor (k) for each area and a real absolute position (p) of the additional element (2) is determined therefrom in relation to the base element (1). In order to draw up the correction factor table (12), the absolute position (p) is also determined at least once previously in each area by means of a position detection device (11) and a corresponding correction factor (k) is stored in the correction factor table (12). |
