发明名称 VERTICAL SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce an ON-resistance without sacrificing a breakdown strength. SOLUTION: A vertical diode is formed by laminating a p<SP>+</SP>-type anode region 42 coming into contact with an anode electrode 52, a drift region 30, and an n<SP>+</SP>-type cathode region 22 coming into contact with a cathode electrode 12. The drift region 30 contains a lamination structure of an n<SP>-</SP>-type first semiconductor layer 36 having a low impurity density, an n<SP>+</SP>-type first semiconductor layer 34 having a high impurity density, and an n<SP>-</SP>-type third semiconductor layer 32 having a low impurity density, from a side of a p<SP>+</SP>-type anode region 42. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006049473(A) 申请公布日期 2006.02.16
申请号 JP20040226525 申请日期 2004.08.03
申请人 TOYOTA CENTRAL RES & DEV LAB INC 发明人 SUZUKI TAKASHI
分类号 H01L29/861;H01L29/78 主分类号 H01L29/861
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