发明名称 Method for etching mesa isolation in antimony-based compound semiconductor structures
摘要 Antimony-based semiconductor devices are formed over a substrate structure ( 10 ) that includes an antimony-based buffer layer ( 24 ) and an antimony-based buffer cap ( 26 ). Multiple epitaxial layers ( 30 - 42 ) formed over the substrate structure ( 10 ) are dry etched to form device mesas ( 12 ) and the buffer cap ( 26 ) provides a desirably smooth mesa floor and electrical isolation around the mesas.
申请公布号 US2006035467(A1) 申请公布日期 2006.02.16
申请号 US20040918119 申请日期 2004.08.12
申请人 NAM PETER S;LANGE MICHAEL D;TSAI ROGER S 发明人 NAM PETER S.;LANGE MICHAEL D.;TSAI ROGER S.
分类号 H01L21/461;H01L21/302 主分类号 H01L21/461
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