发明名称 |
Method for etching mesa isolation in antimony-based compound semiconductor structures |
摘要 |
Antimony-based semiconductor devices are formed over a substrate structure ( 10 ) that includes an antimony-based buffer layer ( 24 ) and an antimony-based buffer cap ( 26 ). Multiple epitaxial layers ( 30 - 42 ) formed over the substrate structure ( 10 ) are dry etched to form device mesas ( 12 ) and the buffer cap ( 26 ) provides a desirably smooth mesa floor and electrical isolation around the mesas.
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申请公布号 |
US2006035467(A1) |
申请公布日期 |
2006.02.16 |
申请号 |
US20040918119 |
申请日期 |
2004.08.12 |
申请人 |
NAM PETER S;LANGE MICHAEL D;TSAI ROGER S |
发明人 |
NAM PETER S.;LANGE MICHAEL D.;TSAI ROGER S. |
分类号 |
H01L21/461;H01L21/302 |
主分类号 |
H01L21/461 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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