TFT-LCD SOURCE DRIVER WITH BUILT-IN TEST CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a TFT-LCD source driver with a built-in test circuit. SOLUTION: The TFT-LCD source driver with the built-in test circuit includes N driving units and P test units. Each driving unit receives digital data and generates an analog output signal according to the digital data. Each test unit receives the analog output signals of M driving units and selects one of them as a test signal according to a select signal and sends a status signal representing abnormality to a external tester in the case of a voltage of the test signal being higher than a high reference voltage or lower than a low reference voltage. The tester generates a test result on the basis of the status signal. Each test unit includes a multiplexer, a first comparator, a second comparator, and a determination unit. COPYRIGHT: (C)2006,JPO&NCIPI