发明名称 Probe retention kit, and system and method for probing a pattern of points on a printed circuit board
摘要 A probe retention kit may include a plurality of probe retention devices, each having: (i) a base; (ii) a retention mechanism, coupled to the base, for mechanically coupling a probe substrate with the plurality of probe retention devices; and (iii) solder legs to be inserted into a printed circuit board, the solder legs having opposite ends that extend through the base and provide an alignment mechanism for receiving the probe substrate. Alternative probe retention devices, and systems and methods using same, are also disclosed.
申请公布号 US2006033518(A1) 申请公布日期 2006.02.16
申请号 US20040918236 申请日期 2004.08.13
申请人 LAMERES BROCK J;HOLCOMBE BRENT;JOHNSON KENNETH 发明人 LAMERES BROCK J.;HOLCOMBE BRENT;JOHNSON KENNETH
分类号 G01R31/02 主分类号 G01R31/02
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