发明名称 Patterning thin metal films by dry reactive ion etching
摘要 We describe a new method for etching patterns in silver, copper, or gold, or other plate metal thin films. A pattern of a hard mask is placed onto the surface of the thin film, followed by a step of reactive ion etching using a plasma formed using a gas feed of some combination of some amounts of methane (CH<SUB>4</SUB>) and hydrogen (H<SUB>2</SUB>), and some or no amount of Argon (Ar). The areas of silver, copper or gold not covered by the hard mask are etched while the hard mask protects those areas that will form the raised portions of thin film in the final structure.
申请公布号 US2006035173(A1) 申请公布日期 2006.02.16
申请号 US20040917511 申请日期 2004.08.13
申请人 DAVIDSON MARK;TOKARZ JEAN;GORRELL JONATHAN 发明人 DAVIDSON MARK;TOKARZ JEAN;GORRELL JONATHAN
分类号 G03F7/36 主分类号 G03F7/36
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