发明名称 Memory with test mode output
摘要 Apparatus and methods of forming and operating the apparatus provide a means for a memory to generate a test mode signal to trigger a test in response to the memory detecting a predetermined command from a system bus. In an embodiment, a mode register in the memory includes an indicator to enable or disable issuance of a test mode signal form the memory. The mode register may contain information identifying the predetermined command.
申请公布号 US2006036916(A1) 申请公布日期 2006.02.16
申请号 US20040915663 申请日期 2004.08.10
申请人 MICRON TECHNOLOGY, INC. 发明人 JANZEN JEFFERY W.
分类号 G11C29/00 主分类号 G11C29/00
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