| 摘要 |
A method for sensing a wave-front of specimen light scattered from an illuminated area in a specimen ( 10 ) includes the steps of focusing illumination light into the specimen ( 10 ), directing specimen light scattered in the specimen ( 10 ) to a detector device ( 50 ) having a plurality of detector elements ( 51 ) and being capable to sense light with local resolution, detecting sample light contained in the specimen light with the detector device ( 50 ), said sample light being scattered in a predetermined sample plane ( 11 ) of the specimen ( 10 ) and being selected by a time-based gating of the specimen light, locally resolved measuring phase information of the sample light, and reconstructing the wave-front of the sample light on the basis of the phase information. Furthermore, a method of microscopic imaging with adapted illumination light is described. |
