发明名称 SEMICONDUCTOR STORAGE DEVICE
摘要 <p>The present invention relates to semiconductor storage devices such as memory cells and latches, and its purpose is to provide memory cells or the like that have a high immunity against soft errors. P-type and N-type transistors constituting inverters are paired, and the paired P-type and N-type transistors are disposed on each of separate wafers. The invention comprises four pairs of P-type and N-type transistors coupled to each other; and gate-to-node connection wires that connect nodes, each of which couples the P-type and N-type transistors of a respective pair, with the gates of P-type and N-type transistors in such a direction that prevents a potential inversion, which would occur at a node due to a soft error, from propagating to another node.</p>
申请公布号 WO2006016403(A1) 申请公布日期 2006.02.16
申请号 WO2004JP11487 申请日期 2004.08.10
申请人 FUJITSU LIMITED;TSURUTA, TOMOYA;SHIMIZU, HIROSHI 发明人 TSURUTA, TOMOYA;SHIMIZU, HIROSHI
分类号 (IPC1-7):H01L27/10;H01L21/823;H01L27/092;G11C11/41 主分类号 (IPC1-7):H01L27/10
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