发明名称 |
SEMICONDUCTOR STORAGE DEVICE |
摘要 |
<p>The present invention relates to semiconductor storage devices such as memory cells and latches, and its purpose is to provide memory cells or the like that have a high immunity against soft errors. P-type and N-type transistors constituting inverters are paired, and the paired P-type and N-type transistors are disposed on each of separate wafers. The invention comprises four pairs of P-type and N-type transistors coupled to each other; and gate-to-node connection wires that connect nodes, each of which couples the P-type and N-type transistors of a respective pair, with the gates of P-type and N-type transistors in such a direction that prevents a potential inversion, which would occur at a node due to a soft error, from propagating to another node.</p> |
申请公布号 |
WO2006016403(A1) |
申请公布日期 |
2006.02.16 |
申请号 |
WO2004JP11487 |
申请日期 |
2004.08.10 |
申请人 |
FUJITSU LIMITED;TSURUTA, TOMOYA;SHIMIZU, HIROSHI |
发明人 |
TSURUTA, TOMOYA;SHIMIZU, HIROSHI |
分类号 |
(IPC1-7):H01L27/10;H01L21/823;H01L27/092;G11C11/41 |
主分类号 |
(IPC1-7):H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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