发明名称 Lithographic apparatus and device manufacturing method
摘要 A lithographic apparatus is disclosed. The apparatus includes an illumination system configured to condition a radiation beam, and a support constructed to support a patterning device. The patterning device is capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam. The apparatus also includes a substrate table constructed to hold a substrate, a projection system configured to project the patterned radiation beam onto a target portion of the substrate, a liquid supply system configured to at least partly fill a space between the projection system and the substrate with liquid, a seal member arranged to substantially contain the liquid within the space, and elements to control and/or compensate for evaporation of immersion liquid from the substrate.
申请公布号 US2006033892(A1) 申请公布日期 2006.02.16
申请号 US20040917535 申请日期 2004.08.13
申请人 ASML NETHERLANDS B.V. 发明人 CADEE THEODORUS P.M.;OTTENS JOOST J.;MERTENS JEROEN JOHANNES S.M.;DE JONG FREDERICK E.;GOORMAN KOEN;MENCHTCHIKOV BORIS;STAVENGA MARCO K.;SMEETS MARTIN F.P.;VAN MEER ASCHWIN LODEWIJK H.J.;SCHOONDERMARK BART L.P.;TINNEMANS PATRICIUS A.J.;NIHTIANOV STOYAN
分类号 G03B27/52;G03F7/20 主分类号 G03B27/52
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