Image sensing integrated circuit test apparatus and method

摘要

An image sensing integrated circuit test device can include a plurality of conductive leads for making electrical contact with at least one integrated circuit device under test. A light directing structure can direct light onto the at least one integrated circuit device under test. The light directing structure includes a top member disposed in a lateral direction and having at least one aperture formed therein. For each aperture, a blocking member can be attached to the top member and disposed in a longitudinal direction around the aperture. The blocking member can prevent light arriving through the aperture from propagating in the lateral direction.