METHODE UND VORRICHTUNG FÜR DIE KONSTRUKTION VON LOW-DENSITY PARITY CHECK (LDPC) MATRIZEN,申请号AT20050253997T-传众专利搜索

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发明名称	METHODE UND VORRICHTUNG FÜR DIE KONSTRUKTION VON LOW-DENSITY PARITY CHECK (LDPC) MATRIZEN
摘要
申请公布号	AT405994(T)	申请公布日期	2008.09.15
申请号	AT20050253997T	申请日期	2005.06.28
申请人	SAMSUNG ELECTRONICS CO., LTD.	发明人	KIM, HYUN-JUNG;LEE, YOON-WOO
分类号	H03M13/11	主分类号	H03M13/11
代理机构		代理人
主权项
地址

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