发明名称 Non-contact technique to monitor surface stress
摘要 A non-contact method for evaluating stress in a substrate. An impurity is non-uniformly introduced into at least one region of a crystalline substrate. The crystalline substrate is subjected to physical stress. Fluorescence producing energy is directed at the crystalline substrate. A fluorescence produced by the crystalline substrate is measured. The fluorescence is correlated with the stress on the crystalline substrate.
申请公布号 US6997061(B2) 申请公布日期 2006.02.14
申请号 US20040847044 申请日期 2004.05.17
申请人 THE JOHNS HOPKINS UNIVERSITY 发明人 MIRAGLIOTTA JOSEPH A.;GROSSMAN KENNETH R.;FRAZER R. KELLY;BAMBERGER, JR. ROBERT J.
分类号 G01L1/24;G01L5/00 主分类号 G01L1/24
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