发明名称 Wafer level chip scale packaging structure and method of fabricating the same
摘要 A wafer level chip scale packaging structure and the method of fabricating the same are disclosed to form a sacrificial layer below the bump using a normal semiconductor process. The bump is used to connect the signals between the Si wafer and the PCB. The interface between the sacrificial layer and the PCB is the weakest part in the whole structure. When the stress applied to the bump is overloaded, the interface between the sacrificial layer and the PCB will crash to remove the stress generated by different thermal expansion coefficients of the Si wafer and the PCB. The sacrificial layer would help avoid the crash occurring to the bump to protect the electrical conduction between the Si wafer and the PCB.
申请公布号 US6998718(B2) 申请公布日期 2006.02.14
申请号 US20040765961 申请日期 2004.01.29
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 CHANG SHU-MING;SHEN LEE-CHENG
分类号 H01L23/52;H01L21/60;H01L23/02;H01L23/31;H01L23/48;H01L23/485;H01L29/40 主分类号 H01L23/52
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