THE APPARATUS FOR BUILT IN TESTING OF MICROWAVE MONOLITHIC INTEGRATED CIRCUIT AMPLIFIERS,申请号KR20040023430-传众专利搜索

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发明名称	THE APPARATUS FOR BUILT IN TESTING OF MICROWAVE MONOLITHIC INTEGRATED CIRCUIT AMPLIFIERS
摘要
申请公布号	KR100552195(B1)	申请公布日期	2006.02.13
申请号	KR20040023430	申请日期	2004.04.06
申请人		发明人
分类号	G01R19/165;H03F3/189	主分类号	G01R19/165
代理机构		代理人
主权项
地址

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