发明名称 Integrating n-type and p-type metal gate transistors
摘要 At least a p-type and n-type semiconductor device deposited upon a semiconductor wafer containing metal or metal alloy gates. More particularly, a complementary metal-oxide-semiconductor (CMOS) device is formed on a semiconductor wafer having n-type and p-type metal gates.
申请公布号 US2006030104(A1) 申请公布日期 2006.02.09
申请号 US20050248737 申请日期 2005.10.11
申请人 DOCZY MARK;BRASK JUSTIN K;KEATING STEVEN J;BARNS CHRIS E;DOYLE BRIAN S;MCSWINEY MICHAEL L;KAVALIEROS JACK T;BARNAK JOHN P 发明人 DOCZY MARK;BRASK JUSTIN K.;KEATING STEVEN J.;BARNS CHRIS E.;DOYLE BRIAN S.;MCSWINEY MICHAEL L.;KAVALIEROS JACK T.;BARNAK JOHN P.
分类号 H01L21/336;H01L21/3213;H01L21/8238;H01L29/49;H01L29/78 主分类号 H01L21/336
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