发明名称 METHOD FOR PRODUCING INDEPENDENT MULTIDIMENSIONAL CALIBRATING PATTERNS
摘要 <p>The invention relates to analytical instrument engineering and can be used for designing calibrating patterns of measuring devices for determining one or several secondary properties of an unknown sample on the basis of the measuring results of a plurality of the primary properties thereof. The inventive method consists in selecting a calibrating set for samples whose secondary properties are known and are defined by means of reference methods, in measuring the primary properties of each said sample by means of a reference device, in converting the measuring results into a form corresponding to the calibratable device, in forming a calibrating pattern enabling to define the analysed secondary properties of the unknown sample on the basis of the measurement of the plurality of primary properties thereof measured by means of the calibratable device. Said method is characterised in that the mathematics for the calibration translations are determined by selecting the combination of samples therefor and the primary properties of each sample are measured by the reference and calibratable devices. The selection of an independent multidimensional calibrating pattern is carried out by comparing the results and by using a method for verifying the accuracy thereof, thereby taking into account the non-linear differences of technical parameters of the calibratable and reference devices and the operating conditions.</p>
申请公布号 WO2006014123(A1) 申请公布日期 2006.02.09
申请号 WO2005RU00372 申请日期 2005.07.04
申请人 ZUBKOV, VLADIMIR ALEKSANDROVICH;ZHARINOV, KONSTANTIN ANATOLYEVICH;SHAMRAI, ALEKSANDR VALERYEVICH 发明人 ZUBKOV, VLADIMIR ALEKSANDROVICH;ZHARINOV, KONSTANTIN ANATOLYEVICH;SHAMRAI, ALEKSANDR VALERYEVICH
分类号 G01D18/00;G01J3/28;G01N21/25;G01N37/00 主分类号 G01D18/00
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