发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can prevent damages caused by scattering of a fuse on a circuit element, a wiring and a semiconductor substrate. SOLUTION: In the semiconductor device, an insulating layer is formed on the semiconductor substrate provided with the circuit element on the surface, the fuse to be trimmed with a laser is formed on the insulating layer, and a protection film is formed on the fuse. At least one or more cavities are formed in the vicinity of the fuse. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006041257(A) 申请公布日期 2006.02.09
申请号 JP20040220308 申请日期 2004.07.28
申请人 RICOH CO LTD 发明人 TAKEDA SATOSHI
分类号 H01L21/82;H01L21/3205;H01L23/52 主分类号 H01L21/82
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