发明名称 |
LARGE SUBSTRATE TEST SYSTEM |
摘要 |
<p>A method and system (100) for testing one or more large substrate (350) are provided. In one or more embodiments, the system (100) includes a testing chamber (400) having a substrate table (550) disposed therein. The substrate table (550) is adapted to move a substrate (350) within the testing chamber (400) in various directions. More particularly, the substrate table (550) includes a first stage (555) movable in a first direction, and a second stage (560) movable in a second direction, wherein each of the stages (555, 560) moves in an X-direction, Y-direction or both X and Y directions. The system (100) further includes a load lock chamber (200) at least partially disposed below the testing chamber (400), and a transfer chamber (300) coupled to the load lock chamber (200) and the testing chamber (400). In one or more embodiments, the transfer chamber (300) includes a robot (310) disposed therein which is adapted to transfer substrates (350) between the load lock chamber (200) and the testing chamber (400).</p> |
申请公布号 |
WO2006014794(A1) |
申请公布日期 |
2006.02.09 |
申请号 |
WO2005US25999 |
申请日期 |
2005.07.21 |
申请人 |
APPLIED MATERIALS, INC.;BRUNNER, MATTHIAS;KURITA, SHINICHI;BLONIGAN, WENDELL, T.;KEHRBERG, EDGAR |
发明人 |
BRUNNER, MATTHIAS;KURITA, SHINICHI;BLONIGAN, WENDELL, T.;KEHRBERG, EDGAR |
分类号 |
(IPC1-7):G01R31/305;G01R31/26 |
主分类号 |
(IPC1-7):G01R31/305 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|