| 摘要 |
PROBLEM TO BE SOLVED: To quickly detect the status of process variation, and to efficiently perform tuning to each macro included in a chip. SOLUTION: A pulse generating circuit 110 for a detection circuit generates a signal with pulse width corresponding to each process variation based on a clock signal CLK, and outputs each generated signal to detection circuits 120 to 150. Then, an FS detection circuit 120 outputs H data to a latch 1 in an FS status, and an SF detection circuit 130 outputs the H data to a latch 2 in an SF status, and an FF detection circuit 140 outputs the H data to a latch 3 in an FF status, and an SS detection circuit 150 outputs the H data to a latch 4 in an SS status. COPYRIGHT: (C)2006,JPO&NCIPI
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