发明名称 APPARATUS FOR EVALUATING NEAR-FIELD LIGHT
摘要 PROBLEM TO BE SOLVED: To provide an apparatus for evaluating near-field light, capable of accurately discriminating the near-field light from other light (especially interference light) in the vicinity of a near-field light generating element. SOLUTION: The apparatus for evaluating the near-field light is equipped with a scatterer 10 for scattering light; a photodetector 14 which detects the light being scattered by the scatterer 10; a position-changing mechanism 12 which changes the position of the scatterer 10 vertically, in relation to the near-field light 60; and a control section 15 calculating the difference between a first photo detection data which are obtained, by detecting the scattered light in the case the scatterer is arranged on the surface of the near-field light 60; and a second photodetection data which are obtained by detecting the scattered light in the case the scattering means is heightened by a distance Z from a position of the scattering means where above first photodetection data are obtained. According to the apparatus for evaluating the near-field, the distance Z makes the near-field light attenuated, but the other lights are not attenuated, and light can accurately discriminate the near-field light from the other light (especially interference light). COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006038774(A) 申请公布日期 2006.02.09
申请号 JP20040222531 申请日期 2004.07.29
申请人 SHARP CORP 发明人 SUZUKI IPPEI;FUJI HIROSHI
分类号 G01Q30/04;G01Q60/18 主分类号 G01Q30/04
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