发明名称 INSPECTION METHOD AND INSPECTION SUPPORT SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an inspection method capable of reducing the mistake of an inspection target, the leak of inspection, the missing of a trouble place, the erroneous judgment of quality and the like by emphasizing the inspection target, and an inspection support system low in cost and having high general-purpose properties. SOLUTION: A worker arranges a liquid crystal panel 23 so as to cover a circuit board 5 having electronic parts 51, 52, etc. arranged thereon in a spaced-apart state with respect to the circuit board 5. The liquid crystal panel 23 displays a pattern 231 wherein a high light pervious region 231a and a low light pervious region 231b both of which corresponds to the position of the electronic part 51 are included. The worker inspects the electronic part 51 seen through the highlight pervious region 231a in the pattern 231 displayed on the liquid crystal panel 23. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006038596(A) 申请公布日期 2006.02.09
申请号 JP20040217823 申请日期 2004.07.26
申请人 SUMITOMO METAL MICRO DEVICES INC 发明人 FURUYA KENICHI
分类号 G01N21/84;G01N21/956;H05K3/00 主分类号 G01N21/84
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