| 摘要 |
An apparatus for measuring a sample with a circuit pattern including at least a porous low-permittivity hydrogensilsesquioxane material or a material structurally or compositionally similar to the porous low-permittivity hydrogensilsesquioxane. The apparatus includes an electron beam optics unit which enables scanning of a primary electron beam onto the sample, a detector which detects a secondary electron or a reflected electron, an image processing unit which measures a desired portion of the sample irradiated with the primary electron beam based on an output signal of the detector, and a control unit which controls the irradiation energy and density of the primary electron beam onto the sample.
|
