发明名称 |
LITHOGRAPHIC DEVICE AND DEVICE MANUFACTURING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a lithographic device provided with a projection column having a gas-regulated environment that is hardly affected by the fluctuation of an ambient atmosphere. <P>SOLUTION: The lithographic device is disclosed. The lithographic device includes a projection system configured to project a patternized radiation beam on the target portion of a substrate. The projection system includes a housing and a plurality of optical elements disposed in the housing. In addition, the lithographic device includes an inlet for supplying a regulated gas to the housing and a gas discharge section for discharging the regulated gas from the housing to create the gas-regulated environment. At least one gate for making the gas-regulated environment communicate with the ambient atmosphere is disposed. The gate is disposed to perform the predetermined leakage of the regulated gas to the ambient atmosphere. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006041522(A) |
申请公布日期 |
2006.02.09 |
申请号 |
JP20050211635 |
申请日期 |
2005.07.21 |
申请人 |
ASML NETHERLANDS BV;CARL ZEISS SMT AG |
发明人 |
VAN EMPEL TJARKO ADRIAAN R;LOOPSTRA ERIK ROELOF;VAN DER NET ANTONIUS J;VAN DE VIJVER YURI JOHANNES G;GELLRICH BERNARD;JANSEN BAUKE;SANDERSE RENS |
分类号 |
H01L21/027;G03F7/20 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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