发明名称 Nonvolatile semiconductor memory device
摘要 The present invention provides a nonvolatile semiconductor memory device capable of achieving the speeding-up of reading and a reduction in layout area. A control gate electrode of each of memory cell transistors employed in the nonvolatile semiconductor memory device according to the present invention is configured so as to be capable of assuming a first power supply potential (VCC) and a second power supply potential (VPP) higher than the first power supply potential upon its operation. A second NMOS transistor is provided between the gate of a first NMOS transistor that drives a control gate electrode (WL) to the first power supply potential (VCC) and a control signal (/ER) connected to the gate thereof. The source of the second NMOS transistor is inputted with the control signal (/ER) and the drain thereof is connected to the gate of the first NMOS transistor. A PMOS transistor is provided in parallel with the first NMOS transistor. A transfer gate comprising these NMOS and PMOS transistors drives the control gate electrode (WL).
申请公布号 US2006028884(A1) 申请公布日期 2006.02.09
申请号 US20050144767 申请日期 2005.06.06
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 MATSUI KATSUAKI
分类号 G11C29/00;G11C8/00 主分类号 G11C29/00
代理机构 代理人
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