| 发明名称 |
PARTICLE ANALYSIS METHOD AND PARTICLE ANALYSIS DEVICE |
| 摘要 |
A calculation unit (40) obtains the volume magnetic susceptibility of a first particle. Also, the calculation unit (40) obtains the volume magnetic susceptibility of a second particle different from the first particle. Thereafter, the calculation unit (40) obtains a volume occupied by a surface material included in the second particle on the basis of a relationship between the volume magnetic susceptibility of the first particle, the volume of the first particle, the volume magnetic susceptibility of the second particle, the volume of the second particle, the volume occupied by the surface material, and the volume magnetic susceptibility of the surface material. |
| 申请公布号 |
US2016209366(A1) |
申请公布日期 |
2016.07.21 |
| 申请号 |
US201414915062 |
申请日期 |
2014.08.29 |
| 申请人 |
OSAKA UNIVERSITY |
发明人 |
KAWANO Makoto;WATARAI Hitoshi;OTA Nobutoshi |
| 分类号 |
G01N27/76;G01N15/08;G01N15/10 |
主分类号 |
G01N27/76 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A particle analysis method comprising:
obtaining the volume magnetic susceptibility of a first particle; obtaining the volume magnetic susceptibility of a second particle different from the first particle; and obtaining a volume occupied by a surface material included in the second particle on the basis of a relationship between the volume magnetic susceptibility of the first particle, the volume of the first particle, the volume magnetic susceptibility of the second particle, the volume of the second particle, the volume occupied by the surface material, and the volume magnetic susceptibility of the surface material. |
| 地址 |
Osaka JP |
