发明名称 PROBE FOR SURFACE RESISTIVITY MEASUREMENT AND SURFACE RESISTIVITY MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a probe for surface resistivity measurement to stably measure surface resistivity of an object under measurement. SOLUTION: This probe 10a for surface resistivity measurement provided for a surface resistivity measuring instrument 1 used for measuring the surface resistivity of the object 100 under measurement, is equipped with an electrode 13 and a contact part 14a provided on the electrode 13 and making surface-contact with the object 100. The specific resistance of the contact part 14a is greater than that of the electrode 13. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006038760(A) 申请公布日期 2006.02.09
申请号 JP20040222149 申请日期 2004.07.29
申请人 TOSHIBA CORP 发明人 MURASE KIYOSHI
分类号 G01R27/02 主分类号 G01R27/02
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