Prober for electronic devices test system, has prober bar including two ends, and frame connection mechanism that allows for ready relocation of prober bar to frame at selected points

摘要

The prober has a prober bar (420) with two ends, and a frame connection mechanism (412) to allow ready relocation of the prober bar to the frame at selected points along the frame. Electrical contact pins are provided along the bar for placing selected electronic devices in electrical communication with a system controller during testing. The pins provide electrical communication between the prober and a system controller. Independent claims are also included for the following: (A) an electronic devices test system comprising a prober bar having two ends (B) a method for testing electronic devices.