发明名称 STAGE APPARATUS, EXPOSURE SYSTEM, AND EXPOSING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To eliminate flexure of a mask generated by irradiation of the lighting beam while a standard position and attitude are maintained. <P>SOLUTION: On a reticle stage RST for holding a reticle R, setting portions 10a to 10d for supporting four corners of the reticle R is formed. Moreover, attracting ports 27a to 27d for attracting the reticle R through evacuation are respectively formed to the placing portions 10a to 10d. At the time of exposure process, the reticle R is attracted and held with entire portion of the attracting ports 27a to 27d. When the exposing process is interrupted, flexure in the Y direction of the reticle is eliminated by attracting and holding the reticle R only with the attracting ports 27c, 27d, and moreover flexure in the X direction of the reticle is eliminated by attracting and holding the reticle R only with the attracting ports 27b, 27c. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006041012(A) 申请公布日期 2006.02.09
申请号 JP20040215570 申请日期 2004.07.23
申请人 NIKON CORP 发明人 TSUJI TOSHIHIKO
分类号 H01L21/027;G03F7/20;H01L21/683 主分类号 H01L21/027
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