发明名称 ILLUMINATION SYSTEM IN PROJECTION ALIGNER FOR MICROLITHOGRAPHY
摘要 <P>PROBLEM TO BE SOLVED: To provide an illumination system in which reverse effects of polarized light induced birefringence are reduced or removed. <P>SOLUTION: The lighting system in a projection aligner for microlithography comprises a first polarized manipulator PM1, a second polarized manipulator PM2 and at least one optical element L1, L2 arranged in between them. Although the direction of an electric field vector of a light is made to change, with respect to time between these polarized manipulators, a polarization state is ensure to be fixed outside these polarized manipulators. A high-energy light prevents birefringence from being induced in the optical element, arranged in between the two polarized manipulators. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006041540(A) 申请公布日期 2006.02.09
申请号 JP20050221109 申请日期 2005.07.29
申请人 CARL ZEISS SMT AG 发明人 FIOLKA DAMIAN;LINDNER RALF;SCHARNWEBER RALF
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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