发明名称 |
Nitride semiconductor single-crystal substrate and method of its synthesis |
摘要 |
<p>Fracture toughness of AlGaN single-crystal substrate is improved and its absorption coefficient reduced. A nitride semiconductor single-crystal substrate has a composition represented by the formula Al x Ga 1-x N (0 ‰¤ x ‰¤ 1), and is characterized by having a fracture toughness of (1.2-0.7x) MPa€¢m 1/2 or greater and a surface area of 20 cm 2 , or, if the substrate has a composition represented by the formula Al x Ga 1-x N (0.5 ‰¤ x ‰¤ 1), by having an absorption coefficient of 50 cm -1 or less in a 350 to 780 nm total wavelength range.</p> |
申请公布号 |
EP1624095(A2) |
申请公布日期 |
2006.02.08 |
申请号 |
EP20050016895 |
申请日期 |
2005.08.03 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
FUJIWARA, SHINSUKE;NAKAHATA, SEIJI |
分类号 |
C30B29/40;C30B25/02 |
主分类号 |
C30B29/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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