发明名称 Semiconductor manufacturing resolution enhancement system and method for simultaneously patterning different feature types
摘要 A method and system of making a mask with a transparent substrate thereon is provided. A first resolution enhancement structure is formed on the first portion of the transparent substrate. A second resolution enhancement structure is formed on a second portion of the transparent substrate, with the second resolution enhancement structure different from the first resolution enhancement structure.
申请公布号 US6994939(B1) 申请公布日期 2006.02.07
申请号 US20020283685 申请日期 2002.10.29
申请人 ADVANCED MICRO DEVICES, INC. 发明人 GHANDEHARI KOUROS;YANG JEAN Y.;SPENCE CHRISTOPHER A.
分类号 G03F9/00 主分类号 G03F9/00
代理机构 代理人
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