| 发明名称 |
Testing device with a contact for connecting to a contact of a semiconductor component |
| 摘要 |
A testing device for a semiconductor component including at least one first contact. The testing device contains at least one second contact for producing an electrical connection to the first contact. The second contact is immobile relative to the testing device.
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| 申请公布号 |
US6995582(B2) |
申请公布日期 |
2006.02.07 |
| 申请号 |
US20020195214 |
申请日期 |
2002.07.15 |
| 申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
SCHWEIGER DIETER;WUERZINGER MATHIAS |
| 分类号 |
G01R31/06;G01R31/26;G01R1/04;G01R1/067;G01R1/073;G01R31/28;H01R33/76 |
主分类号 |
G01R31/06 |
| 代理机构 |
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代理人 |
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