发明名称 Methods for manufacturing electronic component and semiconductor device, semiconductor device, circuit board and electronic equipment
摘要 <p>A semiconductor device with its package size close to its chip size has a stress absorbing layer, allows a patterned flexible substrate to be omitted, and allows a plurality of components to be fabricated simultaneously. There is: a step of forming electrodes (12) on a wafer (10); a step of providing a resin layer (14) as a stress relieving layer on the wafer (10), avoiding the electrodes (12); a step of forming a chromium layer (16) as wiring from electrodes (12) over the resin layer (14); a step of forming solder balls as external electrodes on the chromium layer (16) over the resin layer (14); and a step of cutting the wafer (10) into individual semiconductor chips; in the steps of forming the chromium layer (16) and solder balls, metal thin film fabrication technology is used during the wafer process.</p>
申请公布号 KR100549844(B1) 申请公布日期 2006.02.06
申请号 KR20047020812 申请日期 1997.12.04
申请人 发明人
分类号 H01L21/44;H01L21/48;H01L21/50;H01L21/60;H01L21/768;H01L23/31;H01L23/36;H01L23/485;H01L23/532 主分类号 H01L21/44
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