| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an inspection electrode which prevents short circuiting of terminals using an easy method, while realizing effective inspection. <P>SOLUTION: The inspection terminal of a semiconductor chip 104 is electrically connected to an inspection electrode 112, by separately connecting a wiring substrate 103 having the inspection electrode 112 to a wiring substrate 102, having a semiconductor chip 104 mounted and an electrode 113 for normal operation. Furthermore, resin sealing is carried out by the size of the outer circumferential edge of a package to expose an inspection electrode part of the wiring substrate 103 having the inspection electrode 112. Consequently, an inspection electrode which can improve inspection efficiency and does not expose an inspection terminal can be provided. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p> |
