发明名称 Method for positioning dicing line of wafer
摘要 A method for positioning a dicing line includes the steps of: bonding an adhesive tape on a semiconductor layer of a wafer; detecting an image of the wafer by an imaging device on the basis of a light transmitted through the wafer; and determining the dicing line of the wafer on the basis of a position of an image of a marker, which is disposed on the semiconductor layer of the wafer. The image of the marker is obtained by image recognition from the detected image of the wafer.
申请公布号 US2006024920(A1) 申请公布日期 2006.02.02
申请号 US20050169579 申请日期 2005.06.30
申请人 DENSO CORPORATION 发明人 GOTO KEISUKE;YOKOYAMA KENICHI
分类号 H01L21/78;B81C99/00;H01L21/301;H01L21/46 主分类号 H01L21/78
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