发明名称 OPTICAL CHARACTERISTIC MEASURING DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an optical characteristic measuring device capable of measuring a more accurate optical characteristic of a measured object such as an LED chip. <P>SOLUTION: The optical characteristic measuring device comprises a probe needle 200 that contacts with an electrode of the LED chip 10 mounted on a stage 100 and emits light of the LED chip 10, a detecting/measuring means 300 for detecting radiation light of the LED chip 10 and measuring the optical characteristic, and a positioning means 400 for gripping the LED chip 10 at a measuring position on the stage 100 and facing the LED chip 10 to a detecting section 310 of the detecting/measuring means 300. The positioning means 400 has a pair of pawl sections 410 and 410 for gripping the LED chip 10. The pawl sections 410 and 410 are reflecting surfaces 411 and 411 on which the periphery of an abutting section abutting on the LED chip 10 reflects radiation light other than front face light of the LED chip 10 to the detecting section 310. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006030135(A) 申请公布日期 2006.02.02
申请号 JP20040213221 申请日期 2004.07.21
申请人 SEIWA ELECTRIC MFG CO LTD 发明人 NAGASE HIDETOSHI
分类号 G01M11/00;H01L33/00 主分类号 G01M11/00
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