发明名称 METHOD FOR INSPECTING ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To provide a method for inspecting electronic components for simply confirming the occurrence state of cracks of soldered joint parts by a thermal cycle test in a short period. SOLUTION: The method for inspecting the electronic components performs the thermal cycle test by bonding strain sensors 7 on the soldered joint parts of the electronic components 1 mounted by soldering leads 3 on substrates, and determines whether the soldered joint parts are good or not on the basis of electric output obtained by the strain sensors 7 during the thermal cycle test. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006030048(A) 申请公布日期 2006.02.02
申请号 JP20040211147 申请日期 2004.07.20
申请人 SONY CORP 发明人 INOUE YUJI
分类号 G01R31/02 主分类号 G01R31/02
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