| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for detecting wavy defects, which can precisely detect the wavy defect, even when the surface of an object to be measured has a satin finish. <P>SOLUTION: Variations in luminance along line segments, each including a certain number of pixels are acquired from a target pixel in an image omnidirectionaly about the target pixel, and a candidate segment n1 in the direction in which variations in the luminance becomes minimum, is extracted. Then, variations in the luminance along line segments, each including the certain number of pixels are acquired from the top of the candidate segment n1 in a plurality of directions about the top pixel, and a candidate segment n2 in the direction in which the variation in luminance becomes minimum, is extracted. Furthermore, when the angle between the candidate segment n1 and the candidate segment n2 is not more than a prescribed value, variations in the luminance along line segments, each including the certain number of pixels are acquired from the top of the candidate segment n2 in a plurality of directions about the top pixel, and a candidate segment in the direction in which the variation in the luminance becomes minimum, is extracted, and in the same way, above steps are repeated to extract candidate segments n3 to nm. If the number m of the continuously extracted candidate segments n1 to nm is not less than a certain value, the plurality of candidate segments n1 to nm are determined as being wavy defects. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
