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发明名称
SYSTEM OF TEST FOR SEMICONDUCTOR DEVICE AND METHOD FOR TESTING SEMICONDUCTOR DEVICE
摘要
申请公布号
KR20060010418(A)
申请公布日期
2006.02.02
申请号
KR20040059111
申请日期
2004.07.28
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
LEE, KYUNG SOOK;BANG, JEONG HO;SHIN, KYEONG SEON;CHI, DAE GAB
分类号
G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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