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发明名称
Apparatus and method for testing refresh rate of semiconductor device
摘要
申请公布号
KR100548541(B1)
申请公布日期
2006.02.02
申请号
KR19990025695
申请日期
1999.06.30
申请人
发明人
分类号
G11C29/00
主分类号
G11C29/00
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代理人
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