发明名称 DROP TEST DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a drop test device that is connected to a sensor, reduces an influence by a conductive wire introduced to the outside of a tested object, and can make the tested object collide with a collision surface with a fixed attitude. SOLUTION: The drop test device comprises a tested object holding section 5 for holding a portable terminal 1 mounted with the sensor 7 for detecting an impact at least before a drop, a conductive wire regulating section 3 that is connected to the sensor 7 and regulates in the drop direction, the attitude of a part corresponding to at least the drop distance of the portable terminal 1 of the conductive wire 2 that is introduced to the outside of the portable terminal 1 and used for taking out a signal from the sensor 7, and a collision surface 4a, against which the portable terminal 1 collides after the drop. The conductive wire regulating section 3 drops substantially integrally with the portable terminal 1, and the collision surface 4a has a hole 4 for passing the conductive wire regulating section 3 and the conductive wire 2 at the drop test. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006030053(A) 申请公布日期 2006.02.02
申请号 JP20040211353 申请日期 2004.07.20
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TAKESHITA TAKAO;AKIYAMA YASUHIKO
分类号 G01N3/303;G01M7/08 主分类号 G01N3/303
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