发明名称 System for and method of ensuring accurate shadow mask-to-substrate registration in a deposition process
摘要 A deposition system uses the same low coefficient of thermal expansion (CTE) material, for example, a CTE of below 10 ppm/° C. in the temperature range of 0-200° C., for forming both a shadow mask and a substrate upon which depositions occur in order to overcome the heating effects of a high-temperature deposition process, thereby ensuring a uniform expansion and contraction rate of the shadow mask and the substrate.
申请公布号 US2006021869(A1) 申请公布日期 2006.02.02
申请号 US20040900620 申请日期 2004.07.28
申请人 ADVANTECH GLOBAL, LTD 发明人 BRODY THOMAS P.
分类号 C23C14/00;C23C14/32 主分类号 C23C14/00
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