发明名称 Substrate processing method
摘要 A substrate processing method includes a first step of exposing a silicon substrate surface to mixed gas plasma of an inert gas and hydrogen, and a second step of conducting any of oxidation processing, nitridation processing and oxynitridation processing to said silicon substrate surface by plasma processing after said first step, wherein an organic substance remaining on said substrate surface is removed in said first step.
申请公布号 US2006024864(A1) 申请公布日期 2006.02.02
申请号 US20050211495 申请日期 2005.08.26
申请人 TOKYO ELECTRON LIMITED 发明人 NAKANISHI TOSHIO;OZAKI SHIGENORI;SASAKI MASARU
分类号 H01L21/50;H01L21/306;H01L21/3065;H01L21/314;H01L21/316;H01L21/318;H01L29/78 主分类号 H01L21/50
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