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发明名称
WAFER EDGE EXPOSURE METHOD ON PHOTO-LITHOGRAPHY PROGRESS FOR SEMICONDUCTOR FABRICATION
摘要
申请公布号
KR20060009673(A)
申请公布日期
2006.02.01
申请号
KR20040058340
申请日期
2004.07.26
申请人
DONGBUANAM SEMICONDUCTOR INC.
发明人
KIM, OOK HYUN
分类号
H01L21/027
主分类号
H01L21/027
代理机构
代理人
主权项
地址
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