发明名称 |
Quality control apparatus and control method of the same, and recording medium recorded with quality control program |
摘要 |
<p>Various items of data collected at different process steps are associated on production sites where traceability is hard to conduct. A quality control apparatus controls a manufacturing process in order to manufacture products of predetermined quality, including a data storing part which collects measurement data measured by multiple devices disposed in a manufacturing process and stores the collected measurement data along with measured time or collected time; and a scheduler which associates the measurement data of the devices with each other in consideration of dead time generatedbetween the devices at measured time or collected time.</p> |
申请公布号 |
EP1591966(A3) |
申请公布日期 |
2006.02.01 |
申请号 |
EP20050252652 |
申请日期 |
2005.04.28 |
申请人 |
OMRON CORPORATION |
发明人 |
SUGHIHARA SHIRO;FUGII TORU;SONO, MINEO |
分类号 |
G07C3/00;G05B19/418;G06Q50/00;G06Q50/04;G07C3/14 |
主分类号 |
G07C3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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