发明名称 |
Material characterization system |
摘要 |
An electron beam device is provided with an electron beam diffraction image analysis section for calculation of the lattice distance from the diffraction image taken into by the TV camera for observation of the electron beam diffraction image, the EDX analysis section for acquiring a composition of the material, the data base for retrieval of material characterization, and the material characterization section having the data base retrieval function. The material characterization section characterizes the material by retrieving the retrieval data base, based upon the lattice distance data transferred from the electron beam diffraction image analysis section and the element data transferred from the EDX analysis sectio.
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申请公布号 |
US6992286(B2) |
申请公布日期 |
2006.01.31 |
申请号 |
US20040792781 |
申请日期 |
2004.03.05 |
申请人 |
HITACHI-SCIENCE SYSTEMS, LTD. |
发明人 |
YAGUCHI TOSHIE;KAMINO TAKEO;TANIGUCHI YOSHIFUMI |
分类号 |
G01N23/203;G01N23/20;G01N23/225;H01J37/252;H01J37/256;H01J37/26;H01J37/295 |
主分类号 |
G01N23/203 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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